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LAB 04. Advanced Optical Spectroscopy
UV-Vis Spectrophotometer
PerkinElmer Lambda 35, USA
Specifications:
- Radiation sources: Deuterium lamp (UV) and tungsten-halogen lamp (Visible)
- Spectral range: 190 nm – 1100 nm
- Integrating sphere for reflectance measurements
- Selectable spectral bandwidth: 0.5 – 4 nm.
- Scan speed: 7.5 – 2880 nm/min.
- Detector: silicon photodiode
- Dedicated software
Applications:
- UV-Visible absorption, transmittance and reflectance
- Determination of optical parameters and band-gap energy of materials
UV-Vis-NIR Spectrophotometer
PerkinElmer Lambda 750, USA
Specifications:
- Spectral range: 190 nm – 3300 nm
- Integrating sphere for reflectance measurements
- Selectable spectral bandwidth:
- 0.17 – 5 nm in UV-Vis
- 0.2 – 20 nm in NIR
- Radiation sources: Deuterium lamp (UV) and tungsten–halogen lamp (Visible-NIR)
- Detectors:
- Photomultiplier tube (PMT) for UV-Vis
- Peltier-cooled PbS detector for NIR
- Dedicated software
Applications:
- Absorption, transmittance, and reflectance in UV, visible and near-infrared (NIR)
- Determination of optical parameters and band-gap energy of materials
Contact Angle Goniometer
KINO SL250, USA
Specifications:
- Automatic droplet profile analysis
- High-resolution CCD camera
- Precise liquid dispensing
- Dedicated image processing software
Applications:
- Contact angle measurement
- Qualitative and quantitative evaluation of surface hydrophilicity and hydrophobicity
- Wettability analysis
- Investigation of nanostructured surfaces
- Surface quality control
Accessories, consumables and auxiliary tools available in the lab:
- Mirrors, lenses, and optomechanical components for the configuration, alignment, and optimization of optical paths.
- Sample positioning and alignment systems with fine adjustment along one or multiple axes.
- Tweezers available in a variety of shapes, sizes, and functional configurations, manufactured from stainless steel, PTFE (Teflon), and other laboratory-compatible materials, used for the manipulation and transfer of sensitive samples and specimens.
- Standards and reference materials for instrument calibration, as well as substrates made of optical glass, quartz and silicon.
- Accessories for transmittance and reflectance measurements.
- Reference liquids for contact angle measurements, as well as micropipettes for sample preparation and handling.
- Laboratory gloves, lab coats, safety goggles and other personal protective equipment.
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Research & Development Center for Materials and Electronic & Optoelectronic Devices
Faculty of Physics
University of Bucharest
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